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나노탄소탐침 – Nano Indentation

STM 탐침

나노탄소탐침

나노 단위의 표면거칠기로 인한 탐침의 부작용과 상관없는 정밀한 위치와 재현성 있는 측정을 위한 구면의 선대칭 AFM 탐침

고성능 나노결각측정을 AFM 구형 탐침

정렬선이 있는 Chip, 금 피복이 되어 있는Cantilever, 구면의 탄소tip으로 구성

Biosphere 탄소탐침 사양

Tip radius / r	Biosphere-Bxx-NCH	Biosphere-Bxx-FM	Biosphere-Bxx-CONT
20nm (+/-5nm)	Biosphere-B20-NCH	Biosphere-B20-FM	Biosphere-B20-CONT
30nm (+/-5nm)	Biosphere-B30-NCH	Biosphere-B30-FM	Biosphere-B30-CONT
40nm (+/-5nm)	Biosphere-B40-NCH	Biosphere-B40-FM	Biosphere-B40-CONT
50nm (+/-5nm)	Biosphere-B50-NCH	Biosphere-B50-FM	Biosphere-B50-CONT
100nm (+/-10nm)	Biosphere-B100-NCH	Biosphere-B100-FM	Biosphere-B100-CONT
150nm (+/-10nm)	Biosphere-B150-NCH	Biosphere-B150-FM	Biosphere-B150-CONT
300nm (+/-10nm)	Biosphere-B300-NCH	Biosphere-B300-FM	Biosphere-B300-CONT
500nm (+/-10nm)	Biosphere-B500-NCH	Biosphere-B500-FM	Biosphere-B500-CONT
750nm (+/-10nm)	Biosphere-B750-NCH	Biosphere-B750-FM	Biosphere-B750-CONT
1000nm (+/-10nm)	Biosphere-B1000-NCH	Biosphere-B1000-FM	Biosphere-B1000-CONT
1500nm (+/-10nm)	Biosphere-B1500-NCH	Biosphere-B1500-FM	Biosphere-B1500-CONT
2000nm (+/-10nm)	Biosphere-B2000-NCH	Biosphere-B2000-FM	Biosphere-B2000-CONT
Cantilever Parameter	NCHAu	FMAu	CONTAu
Material	Si	Si	Si
Length	125um	225um	450um
Width	30um	28um	50um
Thickness	4um	3um	2um
Force constant	40N/m	2.8N.m	0.2N/m
Resonance frequency	330kHz	75kHz	13kHz
Tip side coating	none	none	none
Back side coating	Au reflex	Au reflex	Au reflex
Chip Parameter
Length	3400um	3400um	3400um
Width	1600um	1600um	1600um
Thickness	315um	315um	315um
Alignment grooves	yes	yes	yes

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