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¿øÀÚÇö¹Ì°æÅ½Ä§Super Sharp Silicon AFM Probes for High Resolution

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Non-contact / Tapping Mode

Force Modulation Microscopy

Contact Mode

Bio/Life Science Application

 

 

 

 

Fast / High Speed Scanning

Electrical Force Microscopy

Magnetic Force Microscopy

SuperSharp Sillicon

 


 

 

 

 

 

SSS-NCH

 

Super Sharp Silicon

Non-contact / Tapping Mode Resonance Frequency

 

SSS-NCH-10 (10°³)

SSS-NCH-20 (20°³)

SSS-NCH-50 (50°³)

¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: SuperSharpSilicon¢â Tip (SSS)

 

Resonant Frequency, kHz

Spring Constant, N/m

length

µm

width

µm

thickness

µm

min

typ

max

min

typ

max

250

320

390

21

42

78

125

30

4

 

 

 

 

 

SSS-SEIH

 

Super Sharp Silicon

Non-contact Node High Force Constant

 

SSS-SEIH-10 (10°³)

SSS-SEIH-20 (20°³)

SSS-SEIH-50 (50°³)

¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: SuperSharpSilicon¢â Tip (SSS)

 

Resonant Frequency, kHz

Spring Constant, N/m

length

µm

width

µm

thickness

µm

min

typ

max

min

typ

max

110

130

150

9

15

25

225

33

5

 

 

 

 

 

SSS-NCL

 

Super Sharp Silicon

Non-contact / Tapping Mode Long AFM Cantilever

 

SSS-NCL-10 (10°³)

SSS-NCL-20 (20°³)

SSS-NCL-50 (50°³)

¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: ¼³¸í: SuperSharpSilicon¢â Tip (SSS)

 

Resonant Frequency, kHz

Spring Constant, N/m

length

µm

width

µm

thickness

µm

min

typ

max

min

typ

max

160

190

210

31

48

71

225

38

7

 

 

 

 


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