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나노탄소탐침 – Spike small and sharp : MSS

앞장

Extreme Aspect Ratio	High Aspect Ratio	Spike small and sharp	MCNT
Enhanced Resolution	Fast Scanning	3D CD Metrokogy	EBD-TESPA AFM Probes
High Resolution AFM Probes	Life Science	Nanoindentation

나노 단위의 표면거칠기로 인한 탐침의 부작용과 상관없는 정밀한 위치와 재현성 있는 측정을 위한 구면의 선대칭 AFM 탐침

고성능 나노결각측정을 AFM 구형 탐침

정렬선이 있는 Chip, 금 피복이 되어 있는 Cantilever, 구면의 탄소tip으로 구성

Spike small and sharp 탄소탐침 사양

	HDC-40	HDC-30	HDC-20	MSS-soft 13 deg	MSS-soft 3 deg	MSS 4-Star NCH
Material	HDC/DLC	HDC/DLC	HDC/DLC	HDC/DLC	HDC/DLC	HDC/DLC
Shape	conical	conical	conical	conical	conical	spike
Tip length / l	400nm	300nm	250nm	250nm	250nm	100nm
Diameter / d	20nm	15nm	10nm	15nm	15um	10um
Half cone angle	<4 degrees	<3 degrees	<3 degrees	<2 degrees	<2 degrees	<6 degrees
Radius / r	2-3nm	2-3nm	2nm	<2nm	<2nm	<2nm
Tilt compensation	3 degrees	3 degrees	3 degrees	13 degrees	3 degrees	12 degrees
Pyramid height / PH	15um	15um	15um	15um	15um	15um
Tip set back / TSB	15um	15um	15um	15um	15um	15um
Cantilever Parameter
Material	Si	Si	Si	Si	Si	Si
Shape	NT-RTESPA	NT-RTESPA	NT-RTESPA	NT-RTESPA	NT-RTESPA	NT-NCH
Length	120um	120um	120um	225um	225um	120um
Width	30um	30um	30um	28um	28um	30um
Thickness	4.4um	4.4um	4.4um	3um	3um	4.4um
Force constant	40N/m	40N/m	40N/m	2.8N/m	2.8N/m	40N/m
Resonance frequency	320kHz	320kHz	320kHz	75kHz	75kHz	320kHz
Tip side coating	none	none	none	none	none	none
Back side coating	reflex	none	none	reflex	reflex	reflex
Chip Parameter
Length	3400um	3400um	3400um	3400um	3400um	3400um
Width	1600um	1600um	1600um	1600um	1600um	1600um
Thickness	315um	315um	315um	315um	315um	315um
Alignment grooves	no	no	no	yes	yes	no

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