HOME          COMPANY          PRODUCTS          CONTACT          

 

 

 


 

 

 

 

 

 

Mikromasch AFM Probe

 

AFM Probe, ũθŽ ̰ ĵƿ

 

- Non Contact / Tapping Mode

- Contact Mode

- Tipless Cantilever

- Serial HARD

- DPER / DPET

- Conductive Non Contact Mode

- Conductive Contact Mode

- Magnetic Force Mode

- High Resolution

- Test Structure

 

 

 

 

 

 

 


 

 

Magnetic Non Contact silicon probes

 

 

Co-Cr coated tip : <60 nm

Co tipside coating : 60 nm

Cr tipside coating : 20 nm

Backside Al coating: 30 nm

Coercitivity : 300 - 400 Oe

 

 

 

 

HQ:NSC18/Co-Cr/Al BS

 

Cantilever

 

Resonant Frequency, kHz

Spring Constant, N/m

length

µm

width

µm

thickness

µm

min

typ

max

min

typ

max

18 Series

60

75

90

2.0

3.5

5.5

230

40

3.0

 

 

Co-Cr coated tip : <60 nm

Co tipside coating : 60 nm

Cr tipside coating : 20 nm

Backside Al coating: 30 nm

Coercitivity : 300 - 400 Oe

 

 

HQ:NSC36/Co-Cr/Al BS : 3 levers

 

Cantilever

 

Resonant Frequency, kHz

Spring Constant, N/m

length

µm

width

µm

thickness

µm

min

typ

max

min

typ

max

36 Series

30

45

25

90

130

65

160

240

115

0.1

0.2

0.-6

1.0

2

0.6

4.6

9.0

2.7

110

90

130

32.5

1.0

 

 


ITB CORPORATION

 

website : www.itbco.co.kr

email : sales@itbco.co.kr

tel : 02-549-8501

fax : 02-549-8502