HOME          COMPANY          PRODUCTS          CONTACT          

 

 

 


 

 

 

 

 

 

Mikromasch AFM Probe

 

AFM Probe, ũθŽ ̰ ĵƿ

 

- Non Contact / Tapping Mode

- Contact Mode

- Tipless Cantilever

- Serial HARD

- DPER / DPET

- Conductive Non Contact Mode

- Conductive Contact Mode

- Magnetic Force Mode

- High Resolution

- Test Structure

 

 

 

 

 

 

 

 


 

 

DPER High Resolution Conductive silicon probes

 

HQ:DPER-XSC11

Pt coated resulting tip radius : <20 nm

Pt overall coating : 15 nm

 

 

Cantilever

 

Resonant Frequency, kHz

Spring Constant, N/m

length

µm

width

µm

thickness

µm

min

typ

max

min

typ

max

11 Series

12

60

115

250

15

80

155

350

18

100

200

465

0.1

1.1

3

17

0.2

2.7

7

42

0.4

5.6

16

90

500

210

150

100

30

30

30

50

2.7

 

 

 

 

DPE Low Noise Conductive silicon probes

 

HQ:DPE-XSC11

Pt coated resulting tip radius : <40 nm

Pt overall coating : 50 nm

 

 

Cantilever

 

Resonant Frequency, kHz

Spring Constant, N/m

length

µm

width

µm

thickness

µm

min

typ

max

min

typ

max

11 Series

12

60

115

250

15

80

155

350

18

100

200

465

0.1

1.1

3

17

0.2

2.7

7

42

0.4

5.6

16

90

500

210

150

100

30

30

30

50

2.7

 

 


ITB CORPORATION

 

website : www.itbco.co.kr

email : sales@itbco.co.kr

tel : 02-549-8501

fax : 02-549-8502