HOME          COMPANY          PRODUCTS          CONTACT          

 

 

 


 

 

 

 

 

 

AFM, STM tip

 

AFM Probe (Ǹ ĵƿ, źŽħ, ̾ƸŽħ), STM tip, ̾Ƹ

 

- AFM Probe, Mikromasch

- AFM Probe, NanoWorld

- STM tip

- Carbon Nano tip

- Diamond tip

 

- Diamond Wafer

 

 

 

 

 

 

 


 

 

ũθŽ AFM ĵƿ

 

- Non Contact / Tapping Mode

- Contact Mode

- Tipless Cantilever

- Conductive Non Contact Mode

- Conductive Contact Mode

- Magnetic Mode

- High Resolution

- Test Structures

 

 

 

 

AFM ĵƿ

 

- Non Contact / Tapping Mode

- Force Modulation

- Electrostatic Force Mode

- Magnetic Force Mode

- Contact Mode

- Tipless Cantilever

 

 

STM Žħ

 

- Platiniridium (mechanical grind) tip

- Platiniridium (electro-polishing) tip

- Tunsten tip

- Pt/Ir coated Tungsten tip

- Nikkel (electro-polishing) tip

 

- Pt/Ir Wire

 

 

AFM źŽħ

 

- Extream Aspec Ratio

- Enhanced Resolution

- 3D Metrology

- Life Science

- High Speed AFM

- High Resolution AFM

- Nanoindentation

 

 

Sharp Single Crystal Diamond AFM Probe

 

- Tapping Mode

- Force Modulation

- Contact Mode

- Contact Mode on hard surface

- Nanoindentation

- Force Nanolithography

 

 

̾Ƹ

 

- CVD Diamond

- Si, SiO2 Diamond Wafer

- ̾Ƹ

 

 


ITB CORPORATION

 

website : www.itbco.co.kr

email : sales@itbco.co.kr

tel : 02-549-8501

fax : 02-549-8502